
( Brand: Thorlabs ), ( Manufacturer Part Number: BP109VIS ), ( Model: BP109-VIS )
The BP109-VIS Slit Scanning Beam Profiler from Thorlabs is an innovative and highly accurate instrument designed for the precise measurement and characterization of optical beams across a wide spectrum. This profiler, specifically engineered for wavelengths spanning from 400 to 1100 nm, offers unparalleled versatility for a diverse range of applications in research, development, and industrial settings.
The BP109-VIS employs a slit scanning mechanism to precisely measure the beam size, shape, and intensity, providing a comprehensive understanding of your optical system's performance. The slit scanning technique allows for the measurement of nearly any beam shape, offering exceptional flexibility and adaptability.
This beam profiler features a 20 magnification optical system, ensuring clear and detailed results. The high-speed camera captures images at an impressive 10 Hz, enabling quick and efficient analysis of rapidly changing optical signals. The BP109-VIS is equipped with a high-resolution CCD sensor, which boasts a pixel size of 6.45 m, offering exceptional detail and precision in your measurements.
In addition to its technical prowess, the BP109-VIS Slit Scanning Beam Profiler is designed with user-friendliness in mind. The intuitive software interface allows for easy setup, operation, and data analysis. The profiler is compatible with a variety of software platforms, further enhancing its versatility.
With its exceptional performance, versatility, and user-friendly design, the Thorlabs BP109-VIS Slit Scanning Beam Profiler is an indispensable tool for any lab seeking to optimize their optical systems and achieve superior results.
Product: Thorlabs BP109-VIS Slit Scanning Beam Profiler (400-1100 nm, 20 bp109VIS)
Pros:1. Wide Wavelength Range: The BP109-VIS can measure beam profiles in a wide range of wavelengths (400-1100 nm), making it versatile for a variety of applications.
2. High Resolution: With a resolution of 20 lines per mm, it provides detailed and accurate measurements of beam profiles.
3. Slit Scanning Technology: This technology allows for high-quality, one-dimensional beam profiles, which can be useful for analyzing the intensity distribution along a beam.
4. Compact Design: The device's compact size makes it easy to integrate into various setups.
Cons:1. Single-Dimensional Measurements: As a slit scanning device, it only provides one-dimensional beam profiles. For two-dimensional measurements, other solutions might be needed.
2. Potential Cost: Compared to some other beam profiling methods, the BP109-VIS might be more expensive.
3. Operator Dependent: The quality of the measurements can be affected by the operator's skill and the setup's alignment.
Conclusion:The Thorlabs BP109-VIS Slit Scanning Beam Profiler is a valuable tool for those requiring high-resolution, one-dimensional beam profile measurements within a wide wavelength range. Its compact design makes it easy to integrate into various setups. However, its single-dimensional measurements and potential cost might be a consideration for some users. If you need two-dimensional beam profile measurements or are working with a limited budget, you might want to explore other options.
Recommendation:If you are looking for a high-quality, one-dimensional beam profiler within the wavelength range of 400-1100 nm, the Thorlabs BP109-VIS could be a great choice for your needs. Ensure you have a good understanding of the device's operation and have the budget to accommodate its cost. If you require two-dimensional beam profile measurements or have a limited budget, you might want to consider other products or solutions that better suit your specific requirements.
Features of the profiler include: wave length range: vis high-precision analysis beam quality and spatial power distribution integrated measurement continuous pulsed sources 10 Hz repetition rate variable scanning speed: 1 to 20 high dynamic 72 db automatic manual gain control switchable range NW - w average max-hold functions for m2 measurements a pulse khz is required other pertinent specifications detector type: Si aperture diameter: 9mm slit size: 5 m diameter min: max scan rate. Hz continuously variable sampling resolution: or better port as USB I have tested beam, and power levels between 1 10 w should only be used with short exposure times.
I'm shutting down my optics lab and have surplus Thorlabs slit scanning beam profiles for sale.
2 on win 8 and 10 with no issues. Or better cable and that the is attached to a mounting: m4 x. Original cost was us3, for the bp100 200 series.
This sale does not include the USB 2.